| Paper title: | Risk Extraction and Analysis of Technical Specifications Based on Machine-Learning Algorithms for EPC Bid Documents |
| Authors: | M Park, S-y Lee, J-h Kim, E-b Lee |
| Summary: | w78-2021-paper-021.pdf |
| Type: | conference paper |
| Year of publication: | 2021 |
| Keywords: | Technical Specifications, Risk Extraction, Machine Learning Algorithm, Decision Support System, EPC |
| Series: | w78:2021 |
| ISSN: | 2706-6568 |
| Download paper: | /pdfs/w78-2021-paper-021.pdf |
| Citation: | M Park, S-y Lee, J-h Kim, E-b Lee (2021). Risk Extraction and Analysis of Technical Specifications Based on Machine-Learning Algorithms for EPC Bid Documents. Proceedings of the 38th International Conference of CIB W78, Luxembourg, 13-15 October, pp 204-213 (ISSN: 2706-6568), http://itc.scix.net/paper/w78-2021-paper-021 |